
Q: What is the purpose of the HILEVEL TestBox?
The Many Faceted HILEVEL TestBox
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A HiLevel representative asked us to come up
with a
TestBox for use in low volume production. We did. The rest is history
and a
sequence of applications for the HiLevel TestBox - some rather
compelling and
often unrelated to production. Q’nApp #E12 details the use of TestBox
for
production testing. Other subsequent discoveries, primarily pertaining
to
Failure Analysis, found new and unique ways of deploying our TestBox. A
few of
these cases are covered in the following. 1.
Applying a probe-station,
it used to be necessary to hunt for the RUN button while staring into a
microscope. The TestBox made things
much more convenient. By simply pressing the TestBox button, you can
now start
execution of the test. No more hunting for the RUN button with the
mouse --
simply hold the TestBox in your hand. 2.
In support of liquid
crystal (“hot spot”) IDDQ testing,
ETS2k features a special software routine to assist this valuable tool.
We
repeatedly apply and remove power to the device until a specified
repeat count
is reach. The repeat count, however, is less important than the
intensity level
of the liquid crystal. Hence, when the desired intensity level is
reached we
ideally should to be able to terminate the test quickly. Just use the TestBox. |
3.
With a high-speed IC
handler, minimal time should be dedicated to the task of interrogating
and
processing screen controls. But how can we interrupt the test without
turning
off the IC handler? Just use the
TestBox. Another application of the TestBox is
interruption
of Diagnostics and Calibration. The overhead (and, in many ways,
annoyance) of
letting the operating system interrogate processes can be saved in
favor of the
much simpler task of interrogating the TestBox, saving time in software
execution. We expect to find many more tasks for the
TestBox.
Any suggestion that could help your application? Just call 1-800-HILEVEL and
say: "TestBox!" Also See: Qe11.zip is a zipped Word file
of this Q'nApp. |